Automatic test bench generation for validation of RT-level descriptions: an industrial experience
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Functional test generation for behaviorally sequential models
Proceedings of the conference on Design, automation and test in Europe
RT-Level ITC'99 Benchmarks and First ATPG Results
IEEE Design & Test
ARPIA: A High-Level Evolutionary Test Signal Generator
Proceedings of the EvoWorkshops on Applications of Evolutionary Computing
A novel RTL behavioral description based ATPG method
Journal of Computer Science and Technology
High-level test generation for hardware testing and software validation
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
An efficient evaluation and vector generation method for observability-enhanced statement coverage
Journal of Computer Science and Technology
Evolution of synthetic RTL benchmark circuits with predefined testability
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for considering observability during RT-level ATPG are presented. Metrics range from a really naive and optimistic one too more sophisticated analysis. Metrics are evaluated including them into the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits.