CRIS: a test cultivation program for sequential VLSI circuits
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Sequential circuit test generation in a genetic algorithm framework
DAC '94 Proceedings of the 31st annual Design Automation Conference
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits
ATS '99 Proceedings of the 8th Asian Test Symposium
Advanced Techniques for GA-based sequential ATPGs
EDTC '96 Proceedings of the 1996 European conference on Design and Test
On improving genetic optimization based test generation
EDTC '97 Proceedings of the 1997 European conference on Design and Test
ACTIV-LOCSTEP: A Test Generation Procedure Based on Logic Simulation and Fault Activation
FTCS '97 Proceedings of the 27th International Symposium on Fault-Tolerant Computing (FTCS '97)
Simulator-oriented fault test generator
DAC '77 Proceedings of the 14th Design Automation Conference
LOCSTEP: A Logic Simulation-Based Test Generation Procedure
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers
Test vector chains for increased targeted and untargeted fault coverage
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Path selection for transition path delay faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Pattern sensitivity was proposed earlier as a property to guide simulation-based test generation for combinational or full-scan circuits. Sensitivity is a binary property, i.e., a pattern is either sensitive or not. In this work, we replace the binary sensitivity property by a property that assumes a range of values, called the level of sensitivity. We demonstrate that patterns with high levels of sensitivity tend to detect more faults than patterns with low levels of sensitivity, and therefore, it is important to consider the level of sensitivity of test patterns during test generation. We also describe a procedure for generating sensitive patterns with high levels of sensitivity.