A Model for Crosstalk Noise Evaluation in Deep Submicron Processes

Authors:
Fabrice Ilponse
Affiliations:
-
Venue:
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Year:
2001

Citing 7
Cited 3

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Abstract

To certify the correctness of a design, in deep submicron technologies, the verification process has to cover some new issues. The noise introduced on signals through the crosstalk coupling is one of these emerging problems. In this paper, we propose a model to evaluate the peak value of the noise injected on a signal during the transition of its neighboring signals. This model has been used in a prototype verification tool and has shown a satisfying accuracy within a reasonable computation delay.