An efficient path delay fault coverage estimator
DAC '94 Proceedings of the 31st annual Design Automation Conference
An Exact Non-Enumerative Fault Simulator for Path-Delay Faults
Proceedings of the IEEE International Test Conference on Test and Design Validity
ATPD: An Automatic Test Pattern Generator for Path Delay Faults
Proceedings of the IEEE International Test Conference on Test and Design Validity
An efficient method for computing exact path delay fault coverage
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Segment delay faults: a new fault model
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Accurate Path Delay Fault Coverage is Feasible
ITC '99 Proceedings of the 1999 IEEE International Test Conference
NEST: a nonenumerative test generation method for path delay faults in combinational circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Improving a nonenumerative method to estimate path delay fault coverage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ATPG tools for delay faults at the functional level
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Exact Path Delay Grading with Fundamental BDD Operations
ITC '01 Proceedings of the 2001 IEEE International Test Conference
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We propose a new technique for computing exact fault coverage for any fault model. It consists of appropriate formation and counting of colors. Each color represents a set of faults, and the definition of colors varies according to the fault model. The technique utilizes the two aspects on which the fault coverage for any model depends, the circuit lines and the patterns applied to the circuit. Depending upon the sample space of faults for a given model, the representation of faults as colors differs. Colors are generated in a greedy and on demand manner ensuring they are unique. Even though the technique is simple in nature, it has never been used to calculate fault coverage for any fault model before. In this paper we apply it to calculate the fault coverage for the path delay fault model. Our experimental results show improvement over the existent techniques for abovementioned model.