SIGMA: a simulator for segment delay faults
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits
Journal of Electronic Testing: Theory and Applications
False-Path Removal Using Delay Fault Simulation
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
A testability metric for path delay faults and its application
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
A non-enumerative path delay fault simulator for sequential circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ENHANCED DELAY DEFECT COVERAGE WITH PATH-SEGMENTS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Exact Path Delay Grading with Fundamental BDD Operations
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Color Counting and its Application to Path Delay Fault Coverage
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Accurate Path Delay Fault Coverage is Feasible
ITC '99 Proceedings of the 1999 IEEE International Test Conference
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Implicit deductive fault simulation for complex delay fault models
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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