Pentium® Pro Processor Design for Test and Debug
Proceedings of the IEEE International Test Conference
The good, the bad, and the ugly of silicon debug
Proceedings of the 43rd annual Design Automation Conference
IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors
Proceedings of the 45th annual Design Automation Conference
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Post-silicon bug localization for processors using IFRA
Communications of the ACM
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Embedded debug architecture for bypassing blocking bugs during post-silicon validation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
X-tracer: a reconfigurable X-tolerant trace compressor for silicon debug
Proceedings of the 49th Annual Design Automation Conference
Deterministic Replay Using Global Clock
ACM Transactions on Architecture and Code Optimization (TACO)
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