Explorations in quantum computing
Explorations in quantum computing
Array-based architecture for FET-based, nanoscale electronics
IEEE Transactions on Nanotechnology
Defect tolerant probabilistic design paradigm for nanotechnologies
Proceedings of the 41st annual Design Automation Conference
Challenges and Research Directions in Agent-Oriented Software Engineering
Autonomous Agents and Multi-Agent Systems
Evolvable computing by means of evolvable components
Natural Computing: an international journal
Proceedings of the 42nd annual Design Automation Conference
A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies
IEEE Design & Test
RAS-NANO: a reliability-aware synthesis framework for reconfigurable nanofabrics
Proceedings of the conference on Design, automation and test in Europe: Proceedings
From molecular interactions to gates: a systematic approach
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Accurate and scalable reliability analysis of logic circuits
Proceedings of the conference on Design, automation and test in Europe
A Novel EDA Tool for VLSI Test Vectors Management
Journal of Electronic Testing: Theory and Applications
Formal methods for the analysis and synthesis of nanometer-scale cellular arrays
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Cost-driven repair optimization of reconfigurable nanowire crossbar systems with clustered defects
Journal of Systems Architecture: the EUROMICRO Journal
Reliability analysis of logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
History index of correct computation for fault-tolerant nano-computing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
RAG: an efficient reliability analysis of logic circuits on graphics processing units
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Projections that show the end of CMOS scaling will occur around 2016 have spurred interest in emerging alternative technologies, particularly nanotechnologies, that promise to extend Moore's law beyond 2016.The semiconductor industry has already entered the nanotechnology world: In 2000, it introduced the 130-nm node with a 70-nm gate-length feature size, followed in 2002 by the 90-nm node featuring a critical dimension of 50 nm. Industry leaders see new scalable technologies emerging from the novel alternative architectures and devices being proposed today that will take us through multiple processor generations for another 30 years or so.Reviewing the lessons learned in the semiconductor industry over the past few decades helps us understand the emerging technologies and suggests some criteria for bringing current research efforts into the realm of high-volume manufacturing.