A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies

  • Authors:
  • Chen He;Margarida F. Jacome;Gustavo de Veciana

  • Affiliations:
  • University of Texas at Austin and Freescale Semiconductor Inc.;University of Texas at Austin;University of Texas at Austin

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2005

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Abstract

To address the density, scalability, and reliability challenges of emerging nanotechnologies, the authors propose a hierarchy of design abstractions, constructed as reconfigurable fabric regions, whereby designers assign small functional flows to each region. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.