RAG: an efficient reliability analysis of logic circuits on graphics processing units

  • Authors:
  • Min Li;Michael S. Hsiao

  • Affiliations:
  • Virginia Tech, Blacksburg, VA;Virginia Tech, Blacksburg, VA

  • Venue:
  • DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2012

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Abstract

In this paper, we present RAG, an efficient Reliability Analysis tool based on Graphics processing units (GPU). RAG is a fault injection based parallel stochastic simulator implemented on a state-of-the-art GPU. A two-stage simulation framework is proposed to exploit the high computation efficiency of GPUs. Experimental results demonstrate the accuracy and performance of RAG. An average speedup of 412x and 198x is achieved compared to two state-of-the-art CPU-based approaches for reliability analysis.