Random walks in a supply network
Proceedings of the 40th annual Design Automation Conference
Hierarchical analysis of power distribution networks
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A multigrid-like technique for power grid analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 42nd annual Design Automation Conference
A chip-level electrostatic discharge simulation strategy
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Electrothermal analysis and optimization techniques for nanoscale integrated circuits
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
SMM: Scalable Analysis of Power Delivery Networks by Stochastic Moment Matching
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
3D floorplanning with thermal vias
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Temperature-aware processor frequency assignment for MPSoCs using convex optimization
CODES+ISSS '07 Proceedings of the 5th IEEE/ACM international conference on Hardware/software codesign and system synthesis
Acceleration of random-walk-based linear circuit analysis using importance sampling
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
Fast algorithms for IR voltage drop analysis exploiting locality
Proceedings of the 48th Design Automation Conference
Efficient algorithms for fast IR drop analysis exploiting locality
Integration, the VLSI Journal
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This paper presents a power grid analyzer that combines a divide-and-conquer strategy with a random-walk engine. A single-level hierarchical method is first described and then extended to multi-level and "virtual-layer" hierarchy. Experimental results show that these algorithms not only achieve speedups over the generic random-walk method, but also are more robust in solving various types of industrial circuits. For example, a 71K-node circuit is solved in 4.16 seconds, showing a more than 4 times speedup over the generic method; a 348K-node wire-bond power grid, for which the performance of the generic method degrades, is solved in 75.88 seconds.