IRSIM: an incremental MOS switch-level simulator
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Fast and accurate timing simulation with regionwise quadratic models of MOS I-V characteristics
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
TETA: transistor-level engine for timing analysis
DAC '98 Proceedings of the 35th annual Design Automation Conference
A two moment RC delay metric for performance optimization
ISPD '00 Proceedings of the 2000 international symposium on Physical design
WTA: waveform-based timing analysis for deep submicron circuits
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
PRIMA: passive reduced-order interconnect macromodeling algorithm
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient linear circuit analysis by Pade approximation via the Lanczos process
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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While fast timing analysis methods, such as asymptotic waveform evaluation (AWE), have been well established for linear circuits, the timing analysis for non-linear circuits, which are dominant in digital CMOS circuits, is usually performed by a SPICE like, time domain integration based approach, involving expensive Newton Raphson iterations at numerous time steps. In this paper, we propose a new technique that leads to the transient solution of charge/discharge paths with a complexity equivalent to only K DC operating point calculations, where K is the number of transistors along the path. This is accomplished by approximating each nodal voltage as a piecewise quadratic waveform, whose characteristics can be determined by matching the charge/discharge currents. Experiments on a wide range of circuits show that a 31.6 times speed-up over SPICE transient simulation with 10ps step size can be achieved, while maintaining an average accuracy of 99%.