Multi-Frequency Test Access Mechanism Design for Modular SOC Testing

Authors:
Qiang Xu;Nicola Nicolici
Affiliations:
McMaster University;McMaster University
Venue:
ATS '04 Proceedings of the 13th Asian Test Symposium
Year:
2004

Citing 0
Cited 11

Power-constrained test scheduling for multi-clock domain SoCs

Proceedings of the conference on Design, automation and test in Europe: Proceedings
Modular and rapid testing of SOCs with unwrapped logic blocks

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Power-aware SoC test planning for effective utilization of port-scalable testers

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Test-architecture optimization and test scheduling for SOCs with core-level expansion of compressed test patterns

Proceedings of the conference on Design, automation and test in Europe
SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects

ACM Transactions on Design Automation of Electronic Systems (TODAES)
The efficient TAM design for core-based SOCs testing

WSEAS Transactions on Circuits and Systems
An efficient scheduling algorithm based on multi-frequency tam for SOC testing

WSEAS Transactions on Circuits and Systems
Test Scheduling for Multi-Clock Domain SoCs under Power Constraint

IEICE - Transactions on Information and Systems
Test-access mechanism optimization for core-based three-dimensional SOCs

Microelectronics Journal
Test architecture design and optimization for three-dimensional SoCs

Proceedings of the Conference on Design, Automation and Test in Europe
Integrated test-architecture optimization and thermal-aware test scheduling for 3-D SoCs under pre-bond test-pin-count constraint

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

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Abstract

This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.