Synthesis of reversible sequential elements
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Reversible online BIST using bidirectional BILBO
Proceedings of the 7th ACM international conference on Computing frontiers
Fault Models for Quantum Mechanical Switching Networks
Journal of Electronic Testing: Theory and Applications
Fault diagnosis in reversible circuits under missing-gate fault model
Computers and Electrical Engineering
Derivation of test set for detecting multiple missing-gate faults in reversible circuits
Computers and Electrical Engineering
Online Testable Approaches in Reversible Logic
Journal of Electronic Testing: Theory and Applications
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Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of reversible elements called k-CNOT (controllable NOT) gates. We review the characteristics of k-CNOT circuits and observe that traditional fault models like the stuck-at model may not accurately represent their faulty behavior or test requirements. A new fault model, the missing gate fault (MGF) model, is proposed to better represent the physical failure modes of quantum technologies. It is shown that MGFs are highly testable, and that all MGFs in an N-gate k-CNOT circuit can be detected with from one to 驴N/2驴 test vectors. A design-for-test (DFT) method to make an arbitrary circuit fully testable for MGFs using a single test vector is described. Finally, we present simulation results to determine (near) optimal test sets and DFT configurations for some benchmark circuits.