Enhancing debugging of multiple missing control errors in reversible logic
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Reversible online BIST using bidirectional BILBO
Proceedings of the 7th ACM international conference on Computing frontiers
Reducing the number of lines in reversible circuits
Proceedings of the 47th Design Automation Conference
Proceedings of the Conference on Design, Automation and Test in Europe
Integration, the VLSI Journal
Fault diagnosis in reversible circuits under missing-gate fault model
Computers and Electrical Engineering
RevKit: an open source toolkit for the design of reversible circuits
RC'11 Proceedings of the Third international conference on Reversible Computation
Reversible circuits: recent accomplishments and future challenges for an emerging technology
VDAT'12 Proceedings of the 16th international conference on Progress in VLSI Design and Test
Synthesis and optimization of reversible circuits—a survey
ACM Computing Surveys (CSUR)
Derivation of test set for detecting multiple missing-gate faults in reversible circuits
Computers and Electrical Engineering
Online Testable Approaches in Reversible Logic
Journal of Electronic Testing: Theory and Applications
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Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional circuits such as stuck-at models are not wellsuited to quantum circuits. We derive a family of logical fault models for reversible circuits composed of k- CNOT (k-input controlled-NOT) gates and implementable by many technologies. The models are extensions of the previously proposed single missing-gate fault (MGF) model, and include multiple and partial MGFs. We study the basic detection requirements of the new fault types and derive bounds on the size of their test sets. We also present optimal test sets computed via integer linear programming for various benchmark circuits. These results indicate that, although the test sets are generally very small, partial MGFs may need significantly larger test sets than single MGFs.