Novel technique for testing FPGAs
Proceedings of the conference on Design, automation and test in Europe
NanoFabrics: spatial computing using molecular electronics
ISCA '01 Proceedings of the 28th annual international symposium on Computer architecture
The VERILOG Hardware Description Language
The VERILOG Hardware Description Language
Poirot: Applications of a Logic Fault Diagnosis Tool
IEEE Design & Test
Design and Test of Large Embedded Memories: An Overview
IEEE Design & Test
BIST-Based Diagnostics of FPGA Logic Blocks
Proceedings of the IEEE International Test Conference
A Case for CMOS/nano co-design
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Molecular electronics: devices, systems and tools for gigagate, gigabit chips
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Defect tolerance on the Teramac custom computer
FCCM '97 Proceedings of the 5th IEEE Symposium on FPGA-Based Custom Computing Machines
Tunable Fault Tolerance for Runtime Reconfigurable Architectures
FCCM '00 Proceedings of the 2000 IEEE Symposium on Field-Programmable Custom Computing Machines
Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Testing of Digital Systems
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Defect and Fault Tolerance of Reconfigurable Molecular Computing
FCCM '04 Proceedings of the 12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines
Built-In Self-Test of Molecular Electronics-Based Nanofabrics
ETS '05 Proceedings of the 10th IEEE European Symposium on Test
CAEN-BIST: Testing the NanoFabric
ITC '04 Proceedings of the International Test Conference on International Test Conference
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Chemically assembled electronic nanotechnology (CAEN) is under intense investigation as a possible alternative or complement to CMOS-based computing. CAEN is a form of molecular electronics that uses directed self-assembly and self-alignment to construct electronic circuits from nanometer-scale devices that exploit quantum-mechanical effects. Although expected to have densities greater than 108 gate-equivalents/cm2, CAEN-based systems may possibly exhibit defect densities of up to 10%. The highly defective CAEN circuits will therefore require a completely new approach to manufacturing computational devices. In order to achieve any level of significant yield, it will no longer be possible to discard a device once a defect is found. Instead, a method of using defective chips must be devised. A testing strategy is developed for chemically assembled electronic nanotechnology (CAEN) that takes advantage of reconfigurability to achieve 100% fault coverage and nearly 100% diagnostic accuracy. This strategy is particularly suited for regular architectures with high defect densities.