Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
Temperature effect on delay for low voltage applications
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 39th annual Design Automation Conference
Full chip leakage estimation considering power supply and temperature variations
Proceedings of the 2003 international symposium on Low power electronics and design
System level leakage reduction considering the interdependence of temperature and leakage
Proceedings of the 41st annual Design Automation Conference
Practical repeater insertion for low power: what repeater library do we need?
Proceedings of the 41st annual Design Automation Conference
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
The need for a full-chip and package thermal model for thermally optimized IC designs
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
A global wiring paradigm for deep submicron design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Supply and power optimization in leakage-dominant technologies
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
In this paper, the impact of thermal effects on low-power repeater insertion methodology is studied. An analytical methodology for thermal-aware repeater insertion that includes the electrothermal coupling between power, delay, and temperature is presented, and simulation results with global interconnect repeaters are discussed for 90nm and 65nm technology. Simulation results show that the proposed thermal-aware methodology can save 17.5% more power consumed by the repeaters compared to a thermal-unaware methodology for a given allowed delay penalty. In addition, the proposed methodology also results in a lower chip temperature, and thus, extra leakage power savings from other logic blocks.