An efficient terminal and model order reduction algorithm

  • Authors:
  • Pu Liu;Sheldon X. -D. Tan;Boyuan Yan;Bruce McGaughy

  • Affiliations:
  • Department of Electrical Engineering, University of California, Riverside, CA 92521, USA;Department of Electrical Engineering, University of California, Riverside, CA 92521, USA;Department of Electrical Engineering, University of California, Riverside, CA 92521, USA;Cadence Design Systems Inc., San Jose, CA 95134, USA

  • Venue:
  • Integration, the VLSI Journal
  • Year:
  • 2008

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Abstract

The paper proposes an efficient terminal and model order reduction method for compact modeling of interconnect circuits with many terminals. The new method is inspired by the recently proposed terminal reduction method, SVDMOR [P. Feldmann, F. Liu, Sparse and efficient reduced order modeling of linear subcircuits with large number of terminals, in: Proceedings of the International Conference on Computer Aided Design (ICCAD), 2004, pp. 88-92]. But different from SVDMOR, the new method considers higher order moment information for terminal responses during the terminal reduction and separately applies singular value decomposition (SVD) on both input and output terminals for low-rank approximations. This is in contrast to the SVDMOR method where input and output terminal responses are approximated by SVD at the same time, which can lead to large errors when the numbers of inputs and outputs are quite different. We analyze the passivity requirements for SVD-based terminal and model order reduction and show that the combined passive terminal and MOR using SVD method will not lead an effective terminal reduction in general. Our experimental results show that the proposed ESVDMOR method outperforms the SVDMOR method in terms of accuracy for the same reduced model sizes when the numbers of input and output terminals are quite different.