Numerical continuation methods: an introduction
Numerical continuation methods: an introduction
Phase noise in oscillators: a unifying theory and numerical methods for characterisation
DAC '98 Proceedings of the 35th annual Design Automation Conference
Numerical Initial Value Problems in Ordinary Differential Equations
Numerical Initial Value Problems in Ordinary Differential Equations
Scientific Computing: An Introductory Survey
Scientific Computing: An Introductory Survey
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Performance trade-off analysis of analog circuits by normal-boundary intersection
Proceedings of the 40th annual Design Automation Conference
Manufacturing-Aware Physical Design
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Exact Analytical Equations for Predicting Nonlinear Phase Errors and Jitter in Ring Oscillators
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Statistical Sampling-Based Parametric Analysis of Power Grids
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 47th Design Automation Conference
Two fast methods for estimating the minimum standby supply voltage for large SRAMs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient SRAM failure rate prediction via Gibbs sampling
Proceedings of the 48th Design Automation Conference
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
Proceedings of the 48th Design Automation Conference
Maximum-information storage system: concept, implementation and application
Proceedings of the International Conference on Computer-Aided Design
A fast heuristic approach for parametric yield enhancement of analog designs
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world
Proceedings of the International Conference on Computer-Aided Design
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Failures and yield problems due to parameter variations have become a significant issue for sub-90-nm technologies. As a result, CAD algorithms and tools that provide designers the ability to estimate the effects of variability quickly and accurately are being urgently sought. The need for such tools is particularly acute for static RAM (SRAM) cells and integrated oscillators, for such circuits require expensive and high-accuracy simulation during design. We present a novel technique for fast computation of parametric yield. The technique is based on efficient, adaptive geometric calculation of probabilistic hypervolumes subtended by the boundary separating pass/fail regions in parameter space. A key feature of the method is that it is far more efficient than Monte-Carlo, while at the same time achieving better accuracy in typical applications. The method works equally well with parameters specified as corners, or with full statistical distributions; importantly, it scales well when many parameters are varied. We apply the method to an SRAM cell and a ring oscillator and provide extensive comparisons against full Monte-Carlo, demonstrating speedups of 100--1000x.