Improved ber performance in intra-chip rf/wireless interconnect systems

Authors:
Md. Sajjad Rahaman;Masud Chowdhury
Affiliations:
University of Illinois at Chicago, Chicago, IL, USA;University of Illinois at Chicago, Chicago, IL, USA
Venue:
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Year:
2008

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Abstract

Increasing operating frequency of current and future VLSI systems is putting physical constraint on hard-wired metal interconnect. Several revolutionary approaches to interconnect have been proposed. One of the most feasible approaches is RF/wireless interconnects. This paper evaluates the bit-error-rate (BER) performance of a coherent binary phase-shift keying (BPSK) with linear and systematic channel coding in an intra-chip RF/wireless interconnect system. The results indicate that for a certain range of received signal-to-noise (SNR) ratio, channel coding improves the performance of the RF/wireless interconnect system. Digital implementation of the encoder and decoder circuit block is also shown.