Power consumption and BER of flip-flop inserted global interconnect

  • Authors:
  • Jingye Xu;Abinash Roy;Masud H. Chowdhury

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL;Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL;Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL

  • Venue:
  • VLSI Design
  • Year:
  • 2007

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Abstract

In nanometer scale integrated circuits, concurrent insertion of repeaters and sequential elements into the global interconnect lines has been proposed to support multicycle communication--a concept known as interconnect pipelining. The design targets of an interconnect-pipelining scheme are to ensure high reliability, low-power consumption, and less delay cycles. This paper presents an in-depth analysis of the reliability in terms of bit error rate (BER) and the power consumption of wire-pipelining scheme. In this analysis, the dependencies of power consumption and BER on the number of inserted flip-flops, and the size of repeaters are illustrated. To trade off the design targets (wire delay, BER, and power consumption), a methodology is developed to optimize the repeater size and the number of flip-flops inserted which maximize a user-specified figure of merit. The methodology is demonstrated by calculating optimal solutions for interconnect pipelining for some International Technology Roadmap for Semiconductor technology nodes.