A leakage-energy-reduction technique for cache memories in embedded processors

  • Authors:
  • Seiichiri Fujii;Akihito Sakanaka;Akihiro Chiyonobu;Toshinori Sato

  • Affiliations:
  • Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, 820-8502 Japan;Panasonic Communications Co., Ltd., 4-1-62, Minoshima, Hakata-ku, Fukuoka, 812-8531 Japan;Kyushu Institute of Technology, 680-4, Kawazu, Iizuka, 820-8502 Japan;(Correspd. Tel.: +81 92 847 5188/ Fax: +81 92 847 5190/ E-mail: toshinori.sato@computer.org) Kyushu University, 3-8-33-3F Momochihama, Sawara-ku, Fukuoka, 814-0001 Japan

  • Venue:
  • Journal of Embedded Computing - Embeded Processors and Systems: Architectural Issues and Solutions for Emerging Applications
  • Year:
  • 2006

Quantified Score

Hi-index 0.00

Visualization

Abstract

Power consumption is becoming one of the most importantconstraints for microprocessor design in nanometer-scaletechnologies. Especially, as the transistor supply voltage andthreshold voltage are scaled down, leakage energy consumption isincreased even when the transistor is not switching. This paperproposes a simple technique to reduce the static energy due tosubthreshold leakage current. The key idea of our approach is toallow the ways within a cache to be accessed at different speedsand to place infrequently accessed data into the slow ways. We usedual-V_{t} technique to realize the non-uniform set-associativecache, and propose a simple replacement policy to reduce averageaccess latency. Experimental results on 32-way set-associativecaches demonstrate that any severe increase in clock cycles toexecute application programs is not observed and significant staticenergy reduction can be achieved, resulting in the improvement ofenergy-delay^{2} product.