A timing analysis algorithm for circuits with level-sensitive latches
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Fast statistical timing analysis handling arbitrary delay correlations
Proceedings of the 41st annual Design Automation Conference
Statistical timing analysis in sequential circuit for on-chip global interconnect pipelining
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Correlation-aware statistical timing analysis with non-gaussian delay distributions
Proceedings of the 42nd annual Design Automation Conference
An efficient algorithm for statistical minimization of total power under timing yield constraints
Proceedings of the 42nd annual Design Automation Conference
Static statistical timing analysis for latch-based pipeline designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
An accurate sparse matrix based framework for statistical static timing analysis
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Analytical modeling of SRAM dynamic stability
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Proceedings of the 44th annual Design Automation Conference
Statistical timing verification for transparently latched circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Latch based circuits are widely adopted in high performance circuits. But there is a lack of accurate latch models for doing timing analysis. In this paper, we propose a new latch delay model in the context of SSTA based on a new perspective of latch timing. The proposed latch model also takes into account the external timing variations such as data slew. The new latch model is integrated into SSTA by considering the timing analysis of both the combinational logic network and the clock distribution network simultaneously. The experimental results show that ignoring accurate latch modeling may lead to large errors (e.g., 50% at PDF peak).