Hybrid logical-statistical simulation with thermal and IR-drop mapping for degradation and variation prediction

Authors:
Domenik Helms;Kai Hylla;Wolfgang Nebel
Affiliations:
OFFIS, D26121 Oldenburg, Germany;OFFIS, D26121, Oldenburg, Germany;CvO Univerity, D26121, Oldenburg, Germany
Venue:
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Year:
2009

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Abstract

We present a statistical life-time description for digital systems, which is characterised by short term functional simulation. Temperature and IR-drops for each hardware task of the system are regarded based on a coarse RT floorplan and a component wise prediction of the dynamic and leakage power. By iteratively updating threshold voltage and supply resistances, then dynamic and leakage power, then temperature and IR-drop distribution, electro-thermal coupling as well as long term degradation effects can be described.