Statistical analysis of subthreshold leakage current for VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Active mode leakage reduction using fine-grained forward body biasing strategy
Proceedings of the 2004 international symposium on Low power electronics and design
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Statistical timing analysis under spatial correlations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Design-Time Optimization of Post-Silicon Tuned Circuits Using Adaptive Body Bias
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical Timing Analysis: From Basic Principles to State of the Art
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Run-time adaptive performance compensation using on-chip sensors
Proceedings of the 16th Asia and South Pacific Design Automation Conference
A fine-grained many VT design methodology for ultra low voltage operations
Proceedings of the 2012 ACM/IEEE international symposium on Low power electronics and design
On-chip process variations compensation using an analog adaptive body bias (A-ABB)
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Post-fabrication tuning for mitigating manufacturing variability is receiving a significant attention. To reduce leakage increase involved in performance compensation by body biasing, body bias clustering methods have been proposed. However, conventional methods suffer from a large test cost for tuning after fabrication, since there are a tremendous number of body bias assignments. We in this paper propose a low-cost tuning scheme after fabrication and present a layout aware body bias clustering method. The proposed method estimates average leakage power after post-fabrication tuning, and minimizes it. We applied the proposed method to ultralow voltage circuits for suppressing their high sensitivity to random Vth variability, and demonstrated the effectiveness of the proposed method. In the experiments, by just introducing two clusters, leakage power after post-fabrication tuning was reduced by up to 70% compared to a single cluster case.