Experimental analysis of sequence dependence on energy saving for error tolerant image processing

Authors:
Se Hun Kim;Saibal Mukohopadhyay;Wayne Wolf
Affiliations:
Georgia Institute of Technology, Atlanta, GA, USA;Georgia Institute of Technology, Atlanta, GA, USA;Georgia Institute of Technology, Atlanta, GA, USA
Venue:
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Year:
2009

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Abstract

We present experimental analysis to exploit the sequence dependence on energy saving in error tolerant image processing. Our analysis shows that the error distributions depend not only on combinational inputs but also on the previous state of the logic. We present a new sequential model for low-power delay faults. Our experimental results demonstrate the importance of considering the state of logic when analyzing errors and its dependence on output quality and energy saving. The results show that different input image type leads to very different output quality. This means that more error tolerant image can be operated at lower voltage. The sequence dependence in output quality and energy saving provide a new perspective to design low power multimedia system.