Power variance analysis breaks a masked ASIC implementation of AES

  • Authors:
  • Yang Li;Kazuo Sakiyama;Lejla Batina;Daisuke Nakatsu;Kazuo Ohta

  • Affiliations:
  • The University of Electro-Communications, Tokyo, Japan;The University of Electro-Communications, Tokyo, Japan;Radboud University Nijmegen, Nijmegen, The Netherlands and Katholieke Universiteit Leuven, Leuven, Belgium;The University of Electro-Communications, Tokyo, Japan;The University of Electro-Communications, Tokyo, Japan

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

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Abstract

To obtain a better trade-off between cost and security, practical DPA countermeasures are not likely to deploy full masking that uses one distinct mask bit for each signal. A common approach is to use the same mask on several instances of an algorithm. This paper proposes a novel power analysis method called Power Variance Analysis (PVA) to reveal the danger of such implementations. PVA uses the fact that the side-channel leakage of parallel circuits has a big variance when they are given the same but random inputs. This paper introduces the basic principle of PVA and a series of PVA experiments including a successful PVA attack against a prototype RSL-AES implemented on SASEBO-R.