Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
IEEE Spectrum
Enhanced network flow algorithm for yield optimization
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Design for manufacturability in submicron domain
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Performance - manufacturability tradeoffs in IC design
Proceedings of the conference on Design, automation and test in Europe
IC design in high-cost nanometer-technologies era
Proceedings of the 38th annual Design Automation Conference
EDTC '96 Proceedings of the 1996 European conference on Design and Test
AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Hierarchical extraction of critical area for shorts in very large ICs
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Some Thoughts on the IC Design-Manufacture Interface
IEEE Design & Test
Implementation of a contradiction-based approach to DFM
International Journal of Computer Integrated Manufacturing
Reconfigurable asynchronous logic automata: (RALA)
Proceedings of the 37th annual ACM SIGPLAN-SIGACT symposium on Principles of programming languages
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Integration of design, manufacturing and testing
ITC'94 Proceedings of the 1994 international conference on Test
Hi-index | 0.00 |