Capacitive coupling noise in high-speed VLSI circuits

Authors:
P. Heydari;M. Pedram
Affiliations:
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, CA, USA;-
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2006

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Abstract

Rapid technology scaling along with the continuous increase in the operation frequency cause the crosstalk noise to become a major source of performance degradation in high-speed integrated circuits. This paper presents an efficient metric to estimate the capacitive crosstalk in nanometer high-speed very large scale integration circuits. In particular, we provide closed-form expressions for the peak amplitude, the pulsewidth, and the time-domain waveform of the crosstalk noise. Experimental results show that the maximum error of our noise predictions is less than 13%, while the average error is only 5.82%.