Computing bounds for fault tolerance using formal techniques
Proceedings of the 46th Annual Design Automation Conference
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics
Journal of Electronic Testing: Theory and Applications
An efficient algorithm to verify generalized false paths
Proceedings of the 47th Design Automation Conference
Incremental solving techniques for SAT-based ATPG
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Integration, the VLSI Journal
Improved SAT-based ATPG: more constraints, better compaction
Proceedings of the International Conference on Computer-Aided Design
Automatic concolic test generation with virtual prototypes for post-silicon validation
Proceedings of the International Conference on Computer-Aided Design
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
Journal of Electronic Testing: Theory and Applications
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Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for automatic test pattern generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on conjunctive normal forms (CNFs), the problem has to be transformed. During transformation, relevant information about the problem might get lost and, therefore, is not available in the solving process. In this paper, we present a technique that applies structural knowledge about the circuit during the transformation. As a result, the size of the problem instances decreases, as well as the run time of the ATPG process. The technique was implemented, and experimental results are presented. The approach was combined with the ATPG framework of NXP Semiconductors. It is shown that the overall performance of an industrial framework can significantly be improved. Further experiments show the benefits with regard to the efficiency and robustness of the combined approach.