A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM
Journal of Electronic Testing: Theory and Applications
Test and Testability Techniques for Open Defects in RAM Address Decoders
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Fault Models and Test Strategies for a Two-Bit per Cell DRAM
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
DRAM Fault Modeling and Test Pattern Design
MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing
GRAAL: a Tool for Highly Dependable SRAMs Generation
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Recent developments in dram testing
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
Methods for memory test time reduction
MTDT '96 Proceedings of the 1996 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '96)
An On-Line BISTed SRAM IP Core
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A System-layer Infrastructure for SoC Diagnosis
Journal of Electronic Testing: Theory and Applications
Hard Data on Soft Errors: A Large-Scale Assessment of Real-World Error Rates in GPGPU
CCGRID '10 Proceedings of the 2010 10th IEEE/ACM International Conference on Cluster, Cloud and Grid Computing
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