Handbook of Applied Cryptography
Handbook of Applied Cryptography
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction
ITC '02 Proceedings of the 2002 IEEE International Test Conference
IOLTS '04 Proceedings of the International On-Line Testing Symposium, 10th IEEE
Secure scan: a design-for-test architecture for crypto chips
Proceedings of the 42nd annual Design Automation Conference
Test Control for Secure Scan Designs
ETS '05 Proceedings of the 10th IEEE European Symposium on Test
Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard
ITC '04 Proceedings of the International Test Conference on International Test Conference
VirtualScan: A New Compressed Scan Technology for Test Cost Reduction
ITC '04 Proceedings of the International Test Conference on International Test Conference
Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
An Efficient Approach to Develop Secure Scan Tree for Crypto-Hardware
ADCOM '07 Proceedings of the 15th International Conference on Advanced Computing and Communications
Partial Scan Approach for Secret Information Protection
ETS '09 Proceedings of the 2009 European Test Symposium
Scan-based attack against elliptic curve cryptosystems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Scan-based attacks on linear feedback shift register based stream ciphers
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Scan Attacks and Countermeasures in Presence of Scan Response Compactors
ETS '11 Proceedings of the 2011 Sixteenth IEEE European Test Symposium
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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This paper proposes a new scan-based side-channel attack on RSA public-key cryptographic implementations in the presence of advanced Design for Testability (DfT) techniques. The attack is performed on an actual hardware implementation, for which different test scenarios were conceived (response compaction, X-Masking). The practical aspects of scan-based attacks on the RSA cryptosystem are also presented. Additionally, a novel scan-attack security analysis tool is proposed which helps in evaluating the scan-chain leakage resilience of security circuits.