Exploiting program-level masking and error propagation for constrained reliability optimization

Authors:
Muhammad Shafique;Semeen Rehman;Pau Vilimelis Aceituno;Jörg Henkel
Affiliations:
Karlsruhe Institute of Technology (KIT), Germany;Karlsruhe Institute of Technology (KIT), Germany;Karlsruhe Institute of Technology (KIT), Germany;Karlsruhe Institute of Technology (KIT), Germany
Venue:
Proceedings of the 50th Annual Design Automation Conference
Year:
2013

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Abstract

Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.