Time-efficient automatic test pattern generation systems

On static compaction of test sequences for synchronous sequential circuits

DAC '96 Proceedings of the 33rd annual Design Automation Conference

A Novel Approach to Random Pattern Testing of Sequential Circuits

IEEE Transactions on Computers

Static compaction using overlapped restoration and segment pruning

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design

Fast Static Compaction Algorithms for Sequential Circuit Test Vectors

IEEE Transactions on Computers

Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits

IEEE Transactions on Computers

Test Set Compaction Using Relaxed Subsequence Removal

Journal of Electronic Testing: Theory and Applications

Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits

Journal of Electronic Testing: Theory and Applications

A Practical Vector Restoration Technique for Large Sequential Circuits

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

State relaxation based subsequence removal for fast static compaction in sequential circuits

Proceedings of the conference on Design, automation and test in Europe

Static test sequence compaction based on segment reordering and accelerated vector restoration

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Dynamic test compaction for synchronous sequential circuits using static compaction techniques

FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)

Random pattern testing for sequential circuits revisited

FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)

Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

Generation of representative input vectors for parametric designs: from low precision to high precision

Integration, the VLSI Journal

Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques

Proceedings of the conference on Design, automation and test in Europe - Volume 1