Cluster-cover: a theoretical framework for a class of VLSI-CAD optimization problems

  • Authors:
  • C.-J. Shi;J. A. Brzozowski

  • Affiliations:
  • Univ. of Iowa;Univ. of Waterloo

  • Venue:
  • ACM Transactions on Design Automation of Electronic Systems (TODAES)
  • Year:
  • 1998

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Abstract

This article introduces a mathematical framework called cluster-cover. We show that this framework captures the combinatorial structure of a class of VLSI design optimization problems, including two-level logic minimization, constrained encoding, multilayer topological planar routing, application timing assignment for delay-fault testing, and minimization of monitoring logic for BIST enchancement. These apparently unrelated problems can all be cast into two metaproblems in our framework: finding a maximum cluster and finding a minimum cover. We describe paradigms for developing algorithms for these problems. First, a simple heuristic called greedy peeling is presented and characterized. We derive sufficient conditions that guarantee optimum solutions by greedy peeling. We generalize the performance analysis of a multilayer topological planar routing heuristic to greedy peeling for the general cluster-cover problems. We propose a performance bound of greedy set covering that can be computed efficiently for a given problem instance; this bound is much tighter than the previously known bounds. Second, prime covering—orignally developed for logic minimization—is generalized to finding exact solutions for cluster-cover problems. Previously, only the connection between logic minimizaton and constrained encoding was known.