Timing Verification and the Timing Analysis program
DAC '82 Proceedings of the 19th Design Automation Conference
Synchronous path analysis in MOS circuit simulator
DAC '82 Proceedings of the 19th Design Automation Conference
Hierarchical Delay Test Generation
Journal of Electronic Testing: Theory and Applications
A Novel Solution for Chip-Level Functional Timing Verification
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
TAS: an accurate timing analyser for CMOS VLSI
EURO-DAC '91 Proceedings of the conference on European design automation
On ATPG for multiple aggressor crosstalk faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On the detection of delay faults
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
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In order to ascertain correct operation of digital logic circuits it is necessary to verify correct functional operation as well as correct operation at desired clock rates. To ascertain correct operation at desired clock rates signal propagation delays along a set of selected paths are verified to fall within allowed limits by applying appropriate stimuli. Earlier it was suggested that an appropriate set of paths to test would be the one that includes at least one path, with maximum modeled delay, for each circuit lead or gate input. In this paper, algorithms to select such sets of paths with minimum cardinality are given.