Illegal state space identification for sequential circuit test generation

Authors:
M. H. Konijnenburg;J. Th. van der Linden;A. J. van de Goor
Affiliations:
Faculty of Information Technology and Systems, Delft University of Technology, Delft, The Netherlands;Faculty of Information Technology and Systems, Delft University of Technology, Delft, The Netherlands;Faculty of Information Technology and Systems, Delft University of Technology, Delft, The Netherlands
Venue:
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Year:
1999

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