Iterative [simulation-based genetics + deterministic techniques]= complete ATPG0
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Sequential circuit test generation in a genetic algorithm framework
DAC '94 Proceedings of the 31st annual Design Automation Conference
CRIS: a test cultivation program for sequential VLSI circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
An effective test generation system for sequential circuits
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Simulator-oriented fault test generator
DAC '77 Proceedings of the 14th Design Automation Conference
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Identification of unsettable flip-flops for partial scan and faster ATPG
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Illegal state space identification for sequential circuit test generation
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Techniques for improving the efficiency of sequential circuit test generation
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Dynamic state traversal for sequential circuit test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Deterministic test pattern generation techniques for sequential circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Simulation based test generation for scan designs
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach
Journal of Electronic Testing: Theory and Applications
Verifying the correctness of FPGA logic synthesis algorithms
FPGA '03 Proceedings of the 2003 ACM/SIGDA eleventh international symposium on Field programmable gate arrays
SETN '02 Proceedings of the Second Hellenic Conference on AI: Methods and Applications of Artificial Intelligence
Alternating Strategies for Sequential Circuit ATPG
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
On improving genetic optimization based test generation
EDTC '97 Proceedings of the 1997 European conference on Design and Test
MOSAIC: A Multiple-Strategy Oriented Sequential ATPG for Integrated Circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Combining Symbolic and Genetic Techniques for Efficient Sequential Circuit Test Generation
ETW '00 Proceedings of the IEEE European Test Workshop
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
An Application of Genetic Algorithms and BDDs to Functional Testing
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
TOV: sequential test generation by ordering of test vectors
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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