Transistor level test generation for MOS circuits
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Unified Methods for VLSI Simulation and Test Generation
Unified Methods for VLSI Simulation and Test Generation
Automatic test generation for stuck-open faults in CMOS VLSI
DAC '81 Proceedings of the 18th Design Automation Conference
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Iterative [simulation-based genetics + deterministic techniques]= complete ATPG0
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Sequential circuit test generation in a genetic algorithm framework
DAC '94 Proceedings of the 31st annual Design Automation Conference
Combining deterministic and genetic approaches for sequential circuit test generation
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On static compaction of test sequences for synchronous sequential circuits
DAC '96 Proceedings of the 33rd annual Design Automation Conference
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
K2: an estimator for peak sustainable power of VLSI circuits
ISLPED '97 Proceedings of the 1997 international symposium on Low power electronics and design
Synthesis of Native Mode Self-Test Programs
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Initialization of Sequential Circuits and its Application to ATPG
Journal of Electronic Testing: Theory and Applications
Proptest: a property based test pattern generator for sequential circuits using test compaction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
SAC '97 Proceedings of the 1997 ACM symposium on Applied computing
Hybrid Fault Simulation for Synchronous Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Techniques for improving the efficiency of sequential circuit test generation
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits
IEEE Transactions on Computers
Dynamic state traversal for sequential circuit test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Fast sequential circuit test generation using high-level and gate-level techniques
Proceedings of the conference on Design, automation and test in Europe
Deterministic test pattern generation techniques for sequential circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Simulation based test generation for scan designs
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On Design Validation Using Verification Technology
Journal of Electronic Testing: Theory and Applications
Efficient Sequential Test Generation Based on Logic Simulation
IEEE Design & Test
Genetics-Based Learning of New Heuristics: Rational Scheduling of Experiments and Generalization
IEEE Transactions on Knowledge and Data Engineering
Sequential Circuit Test Generation Using Dynamic State Traversal
EDTC '97 Proceedings of the 1997 European conference on Design and Test
On improving genetic optimization based test generation
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Evolving combinatorial problem instances that are difficult to solve
Evolutionary Computation
On test generation by input cube avoidance
Proceedings of the conference on Design, automation and test in Europe
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