Cell replication and redundancy elimination during placement for cycle time optimization

  • Authors:
  • Ingmar Neumann;Dominik Stoffel;Hendrik Hartje;Wolfgang Kunz

  • Affiliations:
  • J.W.G. University Frankfurt a.M., Department of Computer Science, Electronic Design Automation Group, 60054 Frankfurt a.M., Germany;J.W.G. University Frankfurt a.M., Department of Computer Science, Electronic Design Automation Group, 60054 Frankfurt a.M., Germany;University of Potsdam, Department of Computer Science, Fault Tolerant Computing Group, 14415 Potsdam, Germany;J.W.G. University Frankfurt a.M., Department of Computer Science, Electronic Design Automation Group, 60054 Frankfurt a.M., Germany

  • Venue:
  • ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 1999

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Abstract

This paper presents a new timing driven approach for cell replication tailored to the practical needs of standard cell layout design. Cell replication methods have been studied extensively in the context of generic partitioning problems. However, until now it has remained unclear what practical benefit can be obtained from this concept in a realistic environment for timing driven layout synthesis. Therefore, this paper presents a timing driven cell replication procedure, demonstrates its incorporation into a standard cell placement and routing tool and examines its benefit on the final circuit performance in comparison with conventional gate or transistor sizing techniques. Furthermore, we demonstrate that cell replication can deteriorate the stuck-at fault testability of circuits and show that stuck-at redundancy elimination must be integrated into the placement procedure. Experimental results demonstrate the usefulness of the proposed methodology and suggest that cell replication should be an integral part of the physical design flow complementing traditional gate sizing techniques.