Asynchronous Circuits for Low Power: A DCC Error Corrector
IEEE Design & Test
Testing redundant asynchronous circuits by variable phase splitting
EURO-DAC '94 Proceedings of the conference on European design automation
Automatic generation of synchronous test patterns for asynchronous circuits
DAC '97 Proceedings of the 34th annual Design Automation Conference
Partial scan delay fault testing of asynchronous circuits
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
DFT for fast testing of self-timed control circuits
ATS '95 Proceedings of the 4th Asian Test Symposium
Testing self-timed circuits using partial scan
ASYNC '95 Proceedings of the 2nd Working Conference on Asynchronous Design Methodologies
Sequencer circuits for VLSI programming
ASYNC '95 Proceedings of the 2nd Working Conference on Asynchronous Design Methodologies
ACT: A DFT Tool for Self-Timed Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Towards Totally Self-Checking Delay-Insensitive Systems
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Design automation of real-life asynchronous devices and systems
Foundations and Trends in Electronic Design Automation
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