Perturb and Simplify: Optimizing Combinational Circuits with External Don't Cares

Authors:
Shih-Chieh Chang;Malgorzata Marek-Sadowska
Affiliations:
Synopsys Inc.;Electrical and Computer Engineering Department, University of California at Santa Barbara
Venue:
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Year:
1996

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Abstract

Earlier optimization techniques based on Automatic Test Pattern Generation could not handle external don't cares. We propose a technique that uses external don't cares during the ATPG guided logic optimization. This technique transforms external don't cares into internal don't cares. Thus, the optimization can utilize the external don't cares to obtain better results. Additionally, we also discuss some perturbation techniques to improve further results of logic optimizers. Based on a careful analysis of don't cares migration during incremental changes of an optimized circuit, we have developed a strategy to guide optimization. We have per formed experiments on MCNC and ISCAS benchmarks and the results are very encouraging.