Data compression via textual substitution
Journal of the ACM (JACM)
An Efficient Method for Compressing Test Data
Proceedings of the IEEE International Test Conference
IBM Journal of Research and Development
Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Selective-run built-in self-test using an embedded processor
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Embedded test control schemes for compression in SOCs
Proceedings of the 39th annual Design Automation Conference
A Method for Compressing Test Data Based on Burrows-Wheeler Transformation
IEEE Transactions on Computers
Deterministic Built-in Pattern Generation for Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Test vector decompression via cyclical scan chains and its application to testing core-based designs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Scan Vector Compression/Decompression Using Statistical Coding
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test data compression and test time reduction using an embedded microprocessor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
Matrix-based software test data decompression for systems-on-a-chip
Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip
MICRO: a new hybrid test data compression/ decompression scheme
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.00 |
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data [8]. Our previous method is based on the Burrows-Wheeler transformation on the sequence of test patterns and run-length coding. In this paper, we present a new method, called COMPACT, which further improves our previous method. The key idea of COMPACT is to employ two data compression schemes, run-length coding for data with low activity and GZIP for data with high activity. COMPACT increases the compression ratio of test data, on average, by 1.9 times compared with our previous method.