An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops

Authors:
Seongwon Kim;Mani Soma;Dilip Risbud
Affiliations:
-;-;-
Venue:
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Year:
2000

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Abstract

We propose a new defect-oriented testing of PLL using charge-based frequency measurement BIST (CF-BIST) technique. As no test stimulus is required and the test output is pure digital, low-cost and practical implementation of on-chip BIST for a PLL is possible. Fault simulations using the 900MHz PLL from National Semiconductor Corp. show higher fault coverage than previous test methods.