A new approach to built-in self-testable datapath synthesis based on integer linear programming
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on the 11th international symposium on system-level synthesis and design (ISSS'98)
Elements of the Theory of Computation
Elements of the Theory of Computation
Logic Synthesis and Verification Algorithms
Logic Synthesis and Verification Algorithms
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
Concurrent Error Detection Using Watchdog Processors-A Survey
IEEE Transactions on Computers
Sequential Circuit Design Using Synthesis and Optimization
ICCD '92 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
An Effective BIST Scheme for Datapaths
Proceedings of the IEEE International Test Conference on Test and Design Validity
Versatile BIST: an integrated approach to on-line/off-line BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
New Self-Checking Circuits by Use of Berger-Codes
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Finite State Machine Synthesis with Concurrent Error Detection
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Logic synthesis of multilevel circuits with concurrent error detection
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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On-line monitoring is a useful technique for ensuring system reliability. By continuously supervising the system's operation, a wide range of problems, such as physical defects, transient faults and design errors, can be detected. A monitor M*'s behavior can be viewed as an abstraction of the target system M's behavior, and can be represented by a homomorphic mapping from M to M*. We present a systematic procedure to select homomorphisms for monitor design and measure their costs based on a behavioral fault model. Analysis of the method shows that monitors with very few states and low area can provide high fault coverage. Experimental results are presented which quantify the basic trade-off between area overhead and fault coverage. Simulation results under the industry-standard single stuck-at fault model are also reported.