Embedded Robustness IPs for Transient-Error-Free ICs
IEEE Design & Test
Efficient Decomposition Techniques for FPGAs
HiPC '02 Proceedings of the 9th International Conference on High Performance Computing
SPaRe: Selective Partial Replication for Concurrent Fault Detection in FSMs
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Weight-Based Codes and Their Application to Concurrent Error Detection of Multilevel Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments
Journal of Electronic Testing: Theory and Applications
On-Line Monitor Design of Finite-State Machines
Journal of Electronic Testing: Theory and Applications
Finite State Machine Synthesis with Concurrent Error Detection
ITC '99 Proceedings of the 1999 IEEE International Test Conference
On Concurrent Error Detection with Bounded Latency in FSMs
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Cost-Driven Selection of Parity Trees
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Efficient Realization of Parity Prediction Functions in FPGAs
Journal of Electronic Testing: Theory and Applications
Area Minimization of Exclusive-OR Intensive Circuits in FPGAs
Journal of Electronic Testing: Theory and Applications
Lowering power consumption in concurrent checkers via input ordering
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Nanoelectronic circuits and systems
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation
Journal of Electronic Testing: Theory and Applications
Hybrid CMOS/nanoelectronic digital circuits: devices, architectures, and design automation
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Fault Localization, Error Correction, and Graceful Degradation in Radix 2 Signed Digit-Based Adders
IEEE Transactions on Computers
Law of large numbers system design
Nano, quantum and molecular computing
A combinatorial group testing method for FPGA fault location
ACST'06 Proceedings of the 2nd IASTED international conference on Advances in computer science and technology
Dependable design technique for system-on-chip
Journal of Systems Architecture: the EUROMICRO Journal
Microprocessors & Microsystems
A low-cost concurrent error detection technique for processor control logic
Proceedings of the conference on Design, automation and test in Europe
Approximate logic circuits for low overhead, non-intrusive concurrent error detection
Proceedings of the conference on Design, automation and test in Europe
Sequential element design with built-in soft error resilience
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Evolution of polymorphic self-checking circuits
ICES'07 Proceedings of the 7th international conference on Evolvable systems: from biology to hardware
A cost effective approach for online error detection using invariant relationships
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
One-to-Many: Context-Oriented Code for Concurrent Error Detection
Journal of Electronic Testing: Theory and Applications
Masking timing errors on speed-paths in logic circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Detecting errors using multi-cycle invariance information
Proceedings of the Conference on Design, Automation and Test in Europe
Towards a secure and reliable system
EUC'05 Proceedings of the 2005 international conference on Embedded and Ubiquitous Computing
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints
Journal of Electronic Testing: Theory and Applications
AVF-driven parity optimization for MBU protection of in-core memory arrays
Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Electronic Testing: Theory and Applications
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This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection. All errors caused by single stuck-at faults are detected using a parity-check code. The synthesis procedure (implemented in Stanford CRCs TOPS synthesis system) fully automates the design process, and reduces the cost of concurrent error detection compared with previous methods. An algorithm for selecting a good parity-check code for encoding the circuit outputs is described. Once the code has been selected, a new procedure called structure-constrained logic optimization is used to minimize the area of the circuit as much as possible while still using a circuit structure that ensures that single stuck-at faults cannot produce undetected errors. It is proven that the resulting implementation is path fault secure, and when augmented by a checker, forms a self-checking circuit. The actual layout areas required for self-checking implementations of benchmark circuits generated with the techniques described in this paper are compared with implementations using Berger codes, single-bit parity, and duplicate-and-compare. Results indicate that the self-checking multilevel circuits generated with the procedure described here are significantly more economical