TATOO: an industrial timing analyzer with false path elimination and test pattern generation

  • Authors:
  • Jacques Benkoski;Ronald B. Stewart

  • Affiliations:
  • SGS-Thomson Microelectronics, Grenoble, France;SGS-Thomson Microelectronics, Grenoble, France

  • Venue:
  • EURO-DAC '91 Proceedings of the conference on European design automation
  • Year:
  • 1991

Quantified Score

Hi-index 0.00

Visualization

Abstract

TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes.