Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
DS-LFSR: A New BIST TPG for Low Heat Dissipation
Proceedings of the IEEE International Test Conference
An adjacency-based test pattern generator for low power BIST design
ATS '00 Proceedings of the 9th Asian Test Symposium
VLSID '99 Proceedings of the 12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
A Test Vector Inhibiting Technique for Low Energy BIST Design
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Adapting Scan Architectures for Low Power Operation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Modified Clock Scheme for a Low Power BIST Test Pattern Generator
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Reducing Power Dissipation during Test Using Scan Chain Disable
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
LT-RTPG: A New Test-Per-Scan BIST TPG for Low Heat Dissipation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Minimized Power Consumption For Scan-Based Bist
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A BIST TPG for low power dissipation and high fault coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The stationary probabilities of the states of a single-server queueing system with a modified Markov input flow and inverse service with interruption are determined. The service of an interrupted customer, depending on his type, is either resumed or started anew.