On removing redundancy in sequential circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
State assignment using input/output functions
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
On Removing Redundancies from Synchronous Sequential Circuits with Synchronizing Sequences
IEEE Transactions on Computers
Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Redundancy Removal during High-Level Synthesis Using Scheduling Don‘t-Cares
Journal of Electronic Testing: Theory and Applications
Synthesis of controllers for full testability of integrated datapath-controller pairs
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Isomorph-Redundancy in Sequential Circuits
IEEE Transactions on Computers
Simplifying Sequential Circuit Test Generation
IEEE Design & Test
Classification of Faults in Synchronous Sequential Circuits
IEEE Transactions on Computers
Surprises in Sequential Redundancy Identification
EDTC '96 Proceedings of the 1996 European conference on Design and Test
On Finding Functionally Identical and Functionally Opposite Lines in Combinational Logic Circuits
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
On achieving complete testability of synchronous sequential circuits with synchronizing sequences
ITC'94 Proceedings of the 1994 international conference on Test
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