Post-routing redundant via insertion for yield/reliability improvement
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Redundant-via enhanced maze routing for yield improvement
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Post-routing redundant via insertion and line end extension with via density consideration
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Towards Open Network-on-Chip Benchmarks
NOCS '07 Proceedings of the First International Symposium on Networks-on-Chip
Optimal post-routing redundant via insertion
Proceedings of the 2008 international symposium on Physical design
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Diagnosis and repair method of SoC memory
WSEAS Transactions on Circuits and Systems
Algebra-logical diagnosis model for SoC F-IP
WSEAS Transactions on Circuits and Systems
Optimal embedded repairing of SOC memory
ICC'08 Proceedings of the 12th WSEAS international conference on Circuits
Embedded SOC F-IP diagnosis by using algebraic logical method
ICC'08 Proceedings of the 12th WSEAS international conference on Circuits
An ROBDD-based combinatorial method for the evaluation of yield of defect-tolerant systems-on-chip
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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