An efficient algorithm for 3-D reluctance extraction considering high frequency effect

  • Authors:
  • Mengsheng Zhang;Wenjian Yu;Yu Du;Zeyi Wang

  • Affiliations:
  • Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;Synopsys Inc., CA;Tsinghua University, Beijing, China

  • Venue:
  • ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
  • Year:
  • 2006

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Abstract

As shown in literatures, partial reluctance based circuit analysis is efficient in capturing on-chip inductance effect, because the partial reluctance exhibits much better locality than partial inductance. However, most previous works on reluctance extraction did not take high frequency effect into account and were not efficient enough for 3-D complex structure. In this paper, a new reluctance extraction algorithm is proposed considering the high frequency effect. Numerical experiments demonstrate that our algorithm can handle complex 3-D interconnect structures while exhibiting high accuracy and a speed-up ratio of several tens to hundreds over FastHenry.